Hosmer, David W ,. <br/><br/>
Applied logistic regression / 
By David W Hosmer, Stanley Lemeshow and Rodney X Sturdivant. 
 - 3 ed. 
 - Hoboken, N.J. :  John Wiley & Sons, &copy,  2013. 
 - 500p. ;  00 cm. 
<br/><br/><label>ISBN: </label>9780470582473 
<br/><br/><label>Dewey Class. No.: </label>519.536  / HOS