Scan Statistics : Mehods and Applications / By Joseph Glaz, Vladimir Pozdnyakov and Sylvan Wallenstein.

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Material type: Text

TextPublication details: Bostaon : Birkhauser Boston, 2009.Edition: 1st EdDescription: 394p. ; 00 cmISBN:

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Item type	Current library	Home library	Call number	Status	Date due	Barcode
Books	P.D.U. Central Library	P.D.U. Central Library	519.5 GLA (Browse shelf(Opens below))	Available		17992